Series - W


Automatic current and potential transformer test set for testing ratio error and phase displacement of instrument transformers.

- uncertainty of measurement 10ppm / 10urad
- broad range of corrections
- display of the results in all accepted dimensions
- remote controll and data transfer via RS232 interface
- Standard and Metrology variants available:
- CT + PT
- CT
- PT

Technical Data Standard version
Technical Data Metrology version

ED-00CR


Low voltage unit for capacitive standard divider.
This instrument together with a compressed gas capacitor replaces standard potential transformers
- broad range of division: 5 digit resolution
- highest accuracy of 50 ppm for ratio and phase
- low weight
- remote control and data transfer via RS232 interface



Technical Data

BR-I / U


Electronically compensated current and potential burden
- according IEC 60044 and ANSI/IEEE C57.13 standards
- high precision by compensating uncertainties of the passive burden elements electronically
- wide range of rated voltages / currents and powers
- any burden value up to 200 VA
- add on burdens up to 1'000 VA
- remote control via RS232 interface

Technical Data Current Burden
Technical Data Voltage Burden

- Uncertainty of ratio ± 0.001%
- Uncertainty of phase ± 0.05 Min.
- covers nominal currents from 5 A up to 5 kA
- working range from 1 ... 200 % of nominal current

Technical Data

Current Transformer


Standard current transformer
Our testing methods are set by national and international standards. The relevant standards subdivide the instrument transformers into classes, for which the ratio error and phase angle are specified.

The ratio errors are defined by the relative deviation of the measured amplitudes of the current- or voltage vectors from the nominal values. The phase error is the phase angle of the output minus the phase angle of the input, for a sinusoidal input and output at a fixed frequency. As well known, phase angles will contribute to the measured values of power and thus also the energy.

To verify both types of errors, reference standards are necessary, the measuring uncertainty of which is much smaller than those of the devices to be tested